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authorDan Williams <dan.j.williams@intel.com>2018-09-26 10:47:15 -0700
committerDan Williams <dan.j.williams@intel.com>2018-10-17 10:39:04 -0700
commit0ead11181fe0c9538b185e46a494df21dc7de23a (patch)
tree8c2caab7282e325da4e7c1b37faf27df5d540925 /tools/testing/nvdimm
parent6f07f86c494074a0755930473f67cc8916654221 (diff)
acpi, nfit: Collect shutdown status
Some NVDIMMs, in addition to providing an indication of whether the previous shutdown was clean, also provide a running count of lifetime dirty-shutdown events for the device. In anticipation of this functionality appearing on more devices arrange for the nfit driver to retrieve / cache this data at DIMM discovery time, and export it via sysfs. Reviewed-by: Keith Busch <keith.busch@intel.com> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Diffstat (limited to 'tools/testing/nvdimm')
-rw-r--r--tools/testing/nvdimm/test/nfit.c1
-rw-r--r--tools/testing/nvdimm/test/nfit_test.h24
2 files changed, 1 insertions, 24 deletions
diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index cffc2c5a778d..f1a2a1a7bb1b 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -24,6 +24,7 @@
#include <linux/list.h>
#include <linux/slab.h>
#include <nd-core.h>
+#include <intel.h>
#include <nfit.h>
#include <nd.h>
#include "nfit_test.h"
diff --git a/tools/testing/nvdimm/test/nfit_test.h b/tools/testing/nvdimm/test/nfit_test.h
index 33752e06ff8d..ade14fe3837e 100644
--- a/tools/testing/nvdimm/test/nfit_test.h
+++ b/tools/testing/nvdimm/test/nfit_test.h
@@ -117,30 +117,6 @@ struct nd_cmd_ars_err_inj_stat {
#define ND_INTEL_SMART_INJECT_FATAL (1 << 2)
#define ND_INTEL_SMART_INJECT_SHUTDOWN (1 << 3)
-struct nd_intel_smart {
- __u32 status;
- union {
- struct {
- __u32 flags;
- __u8 reserved0[4];
- __u8 health;
- __u8 spares;
- __u8 life_used;
- __u8 alarm_flags;
- __u16 media_temperature;
- __u16 ctrl_temperature;
- __u32 shutdown_count;
- __u8 ait_status;
- __u16 pmic_temperature;
- __u8 reserved1[8];
- __u8 shutdown_state;
- __u32 vendor_size;
- __u8 vendor_data[92];
- } __packed;
- __u8 data[128];
- };
-} __packed;
-
struct nd_intel_smart_threshold {
__u32 status;
union {